Used JEOL JEM 200CX #9240853 for sale

JEOL JEM 200CX is a scanning electron microscope (SEM) designed for high resolution imaging of sample surfaces. The 200CX features an "ultra-high resolution" field-emission source to provide excellent resolution and contrast,with a maximum resolution of 4 nanometers. The SEM has a spherical aberration corrector (C s ), for improved image resolution and contrast at higher magnifications. The 200CX includes a high-performance energy dispersive spectroscopy (EDS) detector for superior elemental analysis of the sample. The EDS detector is capable of displaying all elements from Be to U and providing detailed information on the sample composition. The microscope also includes a STEM (scanning transmission electron microscope) feature, which utilizes transmission imaging to provide improved resolution and contrast. Additional features of the microscope include an automatic sample handling stage, for easy loading and unloading of samples, and a digital imaging system for easily capturing and recording images. The 200CX can attain sample scanning speeds up to 75 steps per second and can achieve image capture in under 15 seconds per image. JEOL JEM 200 CX SEM offers a wide range of applications, such as elemental analysis of materials, surface analysis, failure analysis, and three-dimensional imaging. It's versatile design and range of features makes the 200CX an excellent choice for a variety of analytical needs. For example, the high resolution imaging capabilities are suitable for examining features on the nanometer scale. Additionally, the EDS detector enables the user to identify and quantify different elements within the sample. The 200CX is a reliable and robust SEM that is easy to operate and maintain. Its ergonomic design allows for easy access to all components and its casted metal base provides increased stability. Additionally, the combination of Ultra-High Resolution mode and the C s corrector provides exceptional imaging capabilities.