Used JEOL JEM 2010 #293639508 for sale
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ID: 293639508
Vintage: 1991
Transmission Electron Microscope (TEM)
Filament: Lab6
Accelerating voltage: 80kV to 200 kV
HT Tank: Insulating gas: SF6
Analytical object pole piece
AMT Camera: Bottom mount, 3296 x 2857 pixels, 9 Mb
Mag range: 2000 to 1.5M (Without AMT Camera)
Mag range: 26000 to 19.5M (With AMT Camera)
Electron diffraction camera length: 8 cm to 200 cm
Single tilt holder: Specimen capacity: 1
Double tilt holder
Motorized stage (X, Y, Z): ±1 mm
Specimen tilt angle: ±30°
Gun and column ion pump: Minimum pressure: 10^-8 torr with cold trap filled
HASKRIS Recirculating water chiller
THERMO FISHER NORAN System 7 EDS (SiLi)
1991 vintage.
JEOL JEM 2010 is a feature-rich scanning electron microscope (SEM) equipment specifically designed for material research, Failure Analysis, and reverse engineering applications. It offers a wide range of capabilities to provide high-resolution imaging and solutions. JEOL JEM-2010 utilizes a combination of three electron columns, which offer a viewing range from 15nm-10μm, with a maximum resolution limit of 1.2nm at 1kV. It is equipped with an advanced in-lens Cs-probe for optimal beam focusing and can operate at high currents up to 200 μA. This allows for beam control with a high level of precision and accuracy. JEM 2010 is capable of producing a variety of imaging modes which enable the user to reveal surface features, and perform elemental mapping, through Energy Dispersive X-Ray Analysis (EDS). Additionally, it is possible to acquire sample electrical characteristics and morphological information at the same time by using the capabilities of Electron Beam Induced Current (EBIC) and Electron Beam Induced Insertion Loss(EBIIL) measurements. JEM-2010 also offers an extensive range of SEM columns, each of which can be tailored to suit the application at hand. JEOL SEM Anti-Vibration System, composed of air or oil dampers, ensures a stable operation, while the Auto Beam Blanking Unit guards the objective lens and sample surface from the electron beam. The specimen stage of this microscope is interchangeable and motorized for manual or programming operation and has a travel range of 110 mm in X, 80 mm in Y, and 20 mm in Z directions. Furthermore, it is equipped with an automatic specimen exchanger and several sample cooling options such as the optional low-temperature extender. JEOL JEM 2010 also features an automated electron control machine to correct the sample drift and focus the beam in real-time, as well as a powerful image processing software that can be used to analyze data. With its multiple sample holders, powerful imaging capabilities, and advanced features, JEOL JEM-2010 is the perfect tool for detailed analysis and imaging of samples.
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