Used JEOL JEM 2010 #293741442 for sale

JEOL JEM 2010 is a high-end scanning electron microscope (SEM), designed to deliver superior imaging performance and maximum operational efficiency. It is equipped with an enhanced electron optical column and a high-performance secondary electron detector, which ensures the highest level of image clarity and resolution. This microscope has a maximum resolution of 15mm at 30 kV, and a projected image size of 1 micron or smaller. Its magnification range is 15x to 300,000x, with the ability to easily switch between various SEM imaging modes. JEOL JEM-2010 also features an advanced automated sample stage with auto focus capabilities and a highly-versatile digital imaging equipment. This allows for dynamic image acquisition and quick analysis. It offers a wide range of specimen imaging possibilities: from ultra-high magnification for SEM imaging, to low magnification for large area surface analyses. It is also equipped with an integrated electron backscatter diffraction (EBSD) system for detailed grain analysis. It can simultaneously acquire bright field, dark field and polarized light images. JEM 2010 has increased efficiency and throughput with features such as auto alignment of the sample using particle image velocimetry, software-assisted specimen centering, and automated image enhancements. For advanced automation and 2D and 3D measurements, JEM-2010 has an AutoVision imageCapture and imageAnalysis software. This automated sample imaging unit features advanced pattern recognition, classification and analysis, and full color stereo reconstruction to make sure results from the microscope are accurate and reliable. JEOL JEM 2010 is designed with easy-to-use controls and easy-to-operate user interface, making it ideal for research and educational facilities. It is even suitable for advanced production lines, with its fast turn-over time and intuitive user-controls. This scanning electron microscope has a modular design concept, with cleanroom-standard compatibility and advanced machine functions. With a high degree of automation, safety mechanisms, and global supports, JEOL JEM-2010 is a reliable choice of SEM for all research and production applications.