Used JEOL JEM 2010 #9192793 for sale

JEOL JEM 2010 is a high-performance scanning electron microscope (SEM) that is ideal for a variety of substrates from micron to nanometer-scale. This powerful instrument captures images of the atomic world by using electrons to create a 3-dimensional image that can be used for research and industrial applications. JEOL JEM-2010 features a large 200mm diameter stage for sample placement which utilizes electromagnetic force to achieve up to 6 degrees of freedom, providing precise and controlled sample movements. This SEM also boasts a high-resolution field emission gun which provides a brightness of up to 10nA of beam current and 1nm of spot size resolution for exceptional image quality. In addition, an advanced electron optical equipment, with three multifunctional deflectors and an objective aperture control system, enables the user to accurately capture an image of the sample. The unit includes a large range of imaging capabilities such as secondary electron imaging for surface information, backscattered electron imaging to view topography and composition, and high-resolution detectors that allow the user to image with high-resolution contrast enhancement. By combining these imaging capabilities, JEM 2010 can detect subtle features such as microstructure, particles, and defects in a range of applications. This versatile instrument provides a wealth of analytical information. In addition to SEM imagery, the optional energy-dispersive X-ray (EDX) detector can provide elemental information. Automated control features, such as automated stage movements and real-time parameter settings, reduce the time taken to carry out analysis. JEM-2010 comes equipped with a software suite that includes image processing and analysis functions. This comprehensive suite, together with third-party applications, provides a wide variety of post-test processing options including 3D reconstructions, spectral analysis, and spectral imaging. The software also provides machine control and connectivity options that ensure a seamless and efficient workflow. In conclusion, JEOL JEM 2010 is an advanced and versatile scanning electron microscope that offers high-resolution imaging and a wide array of analytical capabilities. Its user-friendly design and built-in features make it ideal for industrial and research applications.