Used JEOL JEM 2010 #9207418 for sale

JEOL JEM 2010 is a state-of-the-art scanning electron microscope (SEM) designed to give the highest resolution images available. It is specifically designed to offer advanced mapping capabilities which enable users to study many features in great detail. JEOL JEM-2010 has been developed to meet the demands of research in material science, industrial, and forensic applications. The equipment consists of four major components: the specimen chamber, detector (EMF/EDS/Super X), electron gun, and control system. The specimen chamber has a low noise floor enabling the highest image quality without the need of cleaning or additional accessory equipment. The electrostatic condenser and Faraday cage-type rotating anode help insure optimal image quality with little to no image artifacts. The electron gun is the means by which electrons from all energies are accelerated and focused onto the sample which is contained in the chamber. It is equipped with nickel fiber lenses which allow optimum beam/sample interaction. The super X gun features include a high intensity focus control, very wide reconstruction capabilities, and increased resolution. The detec tor unit allows simultaneous detection of the electron, X-ray, and secondary electron signals that are generated in the evanescent field of the specimen. The detector has a high dynamic range and sensitivity, making it ideal for capturing accurate images. The machine also allows for simultaneous use of EDX/WDS and Super X capabilities to map the samples with elemental and chemical composition as well as other important information. The control tool is integral to the operation of JEM 2010. It consists of a graphical user interface (GUI) along with a variety of software tools that enable users to control all of the aspects of operation, from the beam current and conditions to data analysis and visualization. The software also allows easy integration with other systems, such as 3D mapping and image analysis software. JEM-2010 is a powerful, high-end scanning electron microscope that offers superior image quality and detailed mapping capabilities. It is an ideal tool for any lab environment involved in high-resolution research and analysis. The combination of superior hardware and software makes JEOL JEM 2010 a great choice for anyone interested in the most advanced SEM.