Used JEOL JEM 2010 #9241415 for sale

JEOL JEM 2010 is a scanning electron microscope (SEM) designed for consistent imaging and analysis of samples at a range of magnifications from under 10× to over 100,000×. It can quickly and accurately look at the surface of small biological and non-biological specimens. JEOL JEM-2010 is equipped with an energy dispersive spectroscopy (EDS) equipment which allows it to analyze the elemental composition of samples. This feature enables quantitative analysis of chemical species present in microscopic samples. The SEM is equipped with a 1.2 nanometer chromatic aberration corrector to reduce blurriness in images at higher magnifications. It also has a fast-scanning gantry which provides the highest resolution images of any SEM in its class. JEM 2010 has an active area of 5mm x 5mm and a 20mm working distance. This allows for observation of small samples without requiring an excessive sample-to-objective distance. The upper-right corner of the active area is situated closer to the chamber window view, allowing for higher quality micrographs. The system also employs an integrated digital imaging unit, which provides a powerful level of image manipulation. This feature provides a range of functions including zoom, enlargement, contrast adjustment, sharpness, negative, and non-destructive image editing. It also includes a 1K deep image memory and the facility to store up to 5000 images. JEM-2010 has an 8-segment computer-controlled stage which can move objects up to 100mm horizontally at a 1mm/sec speed. This stage can be used to map slide locations and increase mapping efficiency. It also incorporates a 3D tilt stage which allows for up to 10 degrees of movement in two axes, allowing oblique illumination for enabling depth perception. The integrated column control machine allows for rapid switching between low and high vacuum scanning conditions. This allows the SEM to perform a wide range of imaging from non-conductive to highly-conductive samples and from non-magnetic to magnetic samples, all with one switch. JEOL JEM 2010 is an impressive SEM package backed by an extensive list of features. Its versatility and powerful imaging capabilities make it an excellent choice for use in many scientific, industrial and academic scanning electron microscope applications.