Used JEOL JEM 2010 #9277008 for sale

JEOL JEM 2010 is a high-end scanning electron microscope (SEM) designed for advanced research applications. It incorporates a high-throughput variable pressure electron source for improved instrument performance. This scanning electron microscope is suitable for a wide range of imaging and analytical applications, including basic research of solids and liquids, materials processing and characterization, as well as semiconductor device structure analysis. JEOL JEM-2010 offers a wide variety of analytical capabilities, such as elemental composition determination using Energy Dispersive X-Ray Analysis (EDXA), and semiconductor circuit structural analysis via Secondary Electron (SE) imaging. Its other features include bright field, dark field, polarization, and electron diffraction imaging options. JEM 2010 is equipped with a high-performance electron column, which allows dynamic secondary electron imaging of specimens at higher magnifications. This is further enhanced by an in-column primary electron beam deflection system, giving the user precise control over the primary electron beam and enabling easier focus adjustments. The column of JEM-2010 is also capable of a wide range of accelerating voltages, ranging from 1 to 30 kV, to accommodate different imaging and analytical requirements. This is supplemented by ultra-high resolution scanning capabilities, with a minimum resolution of 2.5 nm. The maximum field of view is 1000 μm. The high throughput variable pressure electron source of JEOL JEM 2010 offers excellent resolution in visualizing finer details of specimen surfaces, increasing productivity. It also offers an efficient and comfortable operating environment with its ergonomic environment that features intuitive design controls. Finally, JEOL JEM-2010 is backed by excellent customer service and support, providing users with the necessary assistance with maintenance and repairs in order to ensure optimum performance of the instrument.