Used JEOL JEM 2010 #9278784 for sale

JEOL JEM 2010 is a scanning electron microscope (SEM) that offers powerful imaging capabilities for research laboratories. It features an acceleration voltage of up to 30 kV, allowing for greater details to be captured with high resolution. Additionally, JEOL JEM-2010 boasts a very wide field of view, with a maximum zoom range of an impressive 8,000x. As such, this microscope is particularly useful for magnifying samples of small features, allowing for a detailed examination of the looked-at structures. This instrument is powered by a field emission gun (FEG) source, minimizing electron beam scanning noise and providing highly-detailed images at incredibly high magnifications. This allows for greater accuracy in the measurement of features such as size, shape, and composition. Furthermore, the microscope's energy dispersive spectroscopy (EDS) system permits quantitative analysis of chemical composition. JEM 2010 is designed with an ergonomic working space and easy accessibility to both the chamber and its auxiliary components. This workflow-streamlining design allows for the smooth and efficient operation of the microscope, which also reduces the risk of component damage due to manual errors. Moreover, its robust design is suitable for long-term stability and reliability. JEM-2010 features innovative cooling systems that eliminate the need for cryogenic refrigeration, as well as computer-controlled active hydrogen purging system for long-term defect-free observation. In conclusion, JEOL JEM 2010 is a powerful scanning electron microscope that offers a variety of features and capabilities essential for the work of research laboratories. With its wide magnification range and numerous control systems, it allows for highly-detailed samples to be analysed accurately and easily.