Used JEOL JEM 2010 #9375954 for sale

JEOL JEM 2010 is a high-performance scanning electron microscope (SEM) designed for a range of applications including surface topography, elemental mapping and structural analysis. JEOL JEM-2010 combines unprecedented control of the incident electron beam, imaging performance and operational simplicity for advanced imaging applications. JEM 2010's powerful electron optics allow precise control of incident electron beam shape, enabling superior spot resolution and enhanced imaging performance. Multi-true Focus Bolometers allow for precise control of deflection angles and beam size and offer excellent resolution from a single spot. The optimized column design also utilizes advanced imaging technology, featuring high-precision angular optics, three-fold aberration corrector and secondary electron-detector for exceptional imaging resolution and contrast. JEM-2010 integrates a range of convenient user-friendly operations including an intuitive graphical user interface and auto-calibration functions. The auto-calibration system simplifies setup of the SEM and allows precise control of imaging parameters such as accelerating voltage and beam current. In addition, the innovative auto-lens-alignment system further ensures consistently accurate imaging. The environmental controls of JEOL JEM 2010 are designed for long-term image stability and consistency. The Column Protection Mechanism utilizes careful regulation of the column pressure and temperature, while the Temperature Control Unit adjusts column temperature as needed. In addition, the innovative stage mechanics and air saturation drive system offer a high level of scanning accuracy, providing superior stability and sample protection. JEOL JEM-2010 is a truly advanced scanning electron microscope, meeting the needs of even the most demanding laboratory. The combination of precision electron optics and powerful automated controls allows for superior imaging performance, along with simplified operation for maximum efficiency. The superior image resolution, user-friendly operation and excellent environmental control of JEM 2010 make it the ideal microscope for a range of research applications.