Used JEOL JEM 2010 #9384836 for sale

JEOL JEM 2010 is a high-resolution, scanning electron microscope (SEM). It is a variable pressure scanning electron microscope capable of imaging samples in a wide range of magnifications, from 10x to 2000x. The low-vacuum imaging capability allows for high-resolution imaging of non-conductive sample materials without the need for metallic coating or staining. The scanning electron beam can also be used for analytical purposes. JEOL JEM-2010 is equipped with an automatic secondary electron detector, two backscattered electron detectors, energy dispersive X-ray spectroscopy (EDS), and a microscope set-up for dual beam imaging. JEM 2010 is designed for both imaging and analysis. It is equipped with a high resolution monochromator with a resolution of 3.4nm at 30kV, providing a very detailed high resolution image. There is also an auto-calibration equipment to adjust the stage position and voltage settings to optimize both imaging and analysis. The high-end imaging and analysis capabilities of JEM-2010 make it ideal for many applications in material research. It is perfect for semiconductor characterization and failure analysis, as well as for forensic imaging. It has also been used successfully in the field of nanoscale research. JEOL JEM 2010 uses plasma-based electron optical lenses to allow for high-resolution imaging in a wide range of magnifications. The microscope also utilizes a range of optics to obtain detailed information about samples. These include an electromagnetic condenser lens, an objective lens, and an objective centerfield lens. The accelerations voltage can be changed for imaging, from 5kV to 30kV, and for analysis, from 0.1kV to 30kV. JEOL JEM-2010 has a unique automated system that enables quick and easy set-up. The automated automatic beam alignment unit quickly and accurately aligns the beam so that the desired resolution is obtained even for challenging samples. The automated staining machine also makes it easier to prepare samples for imaging. JEM 2010 is an excellent high-resolution scanning electron microscope, providing excellent imaging and analytical capabilities. It is perfect for a wide range of sample analysis tasks. The automated systems make set-up and use faster and easier, and the low-vacuum imaging makes it ideal for sample preparation.