Used JEOL JEM 2010 #9394893 for sale

JEOL JEM 2010 is a scanning electron microscope (SEM) that utilizes a high-voltage electron beam in order to magnify and analyze the surface of at sample with extremely high detail. This SEM is capable of providing very high resolution images of up to 0.09 nm with a magnification range of 400-500,000 X. JEOL JEM-2010 is known for its high sensitivity and low running costs, making it an ideal choice for a variety of applications in both research and medical settings. The microscope itself is composed of several components. At the heart of the system is the electron source, the gun assembly, and the specimen stage. The electron source fires a finely focused beam of electrons through a specially designed objective lens. These electrons are then directed to the specimen stage, where they interact with the sample to create magnified images of the surface of the sample. JEM 2010 has a variety of functions that allow it to be used for a variety of applications. It is capable of producing images with high contrast and very good resolution. The microscope can also be used for alignment and measurement of very small features such as metastable areas, gallium arsenide barriers, and very thin films. In addition, it has the capability to capture time-resolved images, which are useful for studying the dynamics of surface phenomena. JEM-2010 also features an integrated EDS system, with X-ray detectors mounted on-axis. This allows for the composition analysis of the sample composition as the electron beam scans it, which can provide valuable information for forensic science or medical research. Overall, JEOL JEM 2010 is an exceptionally powerful scanning electron microscope that offers a wide range of features and capabilities. It is highly versatile and compatible with a variety of accessories and sample stages, making it a great choice for a range of diverse applications.