Used JEOL JEM 2010 #9397253 for sale

A JEOL JEM 2010 is a high-resolution scanning electron microscope (SEM) that provides superior imaging capabilities to analyze the structure of a wide range of Types of samples on the nanoscale. It is ideal for applications in materials science and engineering, geology, biology, and more. JEOL JEM-2010 offers a range of specifications and features that make it a powerful tool for analytical studies. JEM 2010 is a field emission SEM that utilizes a gapless, non-filamentary electron source to produce high quality, high-resolution images with the highest possible contrast. It is equipped with an ultra-high resolution field emission gun, a highly sensitive backscattered electron detector, and an auto-focusing system to capture detailed, nanoscale images with up to 0.2nm scale. Its ultra-high mass resolution enables JEM-2010 to provide images of a sample's outermost atomic layers. In addition to its powerful imaging capabilities, JEOL JEM 2010 also offers X-ray spectrometry and Energy Dispersive X-ray (EDX) functionality to analyze the composition of a sample. It is equipped with an X-ray detector, a wavelength dispersive spectrometer, and an energy dispersive system to detect information on the chemical element concentration in a sample. JEOL JEM-2010 also offers a range of specimen manipulation tools such as a rotatable sample stage and an automated tilt-and-rotatestage. This helps researchers to test various sample conditions quickly and accurately. JEM 2010 has a large magnification range suitable for analyzing a wide range of sample sizes. It offers maximum magnifications up to 300,000x with a minimum output of 2 MV. It also has a tilt angle range of 10-90 degrees for 3D imaging and a precision sample control range of 0.3nm. This ensures that the sample is always at the correct distance from the electron beam for precise measurements. JEM-2010 is capable of imaging at low to high temperatures, with an optimal range of -25°C to +80°C. It also allows the user to adjust the beam current, spot size, and adjustable electron spectral filters for greater versatility in the collected data. The advanced imaging capabilities and broader functionalities of JEOL JEM 2010 make it an ideal tool for nanoscale research.