Used JEOL JEM 2010UHR #9240146 for sale

JEOL JEM 2010UHR scanning electron microscope (SEM) is a powerful high-resolution imaging instrument designed for a variety of sample analysis. JEM 2010UHR is an UHR SEM instrument with an accelerating voltage of up to 200 kV and high contrast and high throughput imaging performance. The microscope features a large specimen chamber that can accommodate a range of sample sizes up to 250 mm in diameter. It also integrates a proprietary in-lens detector, providing excellent image quality at low kV and high pressure operation. This allows for the observation of complete nano-scale structures with low conductive and insulating materials. The SEM also offers a unique combination of techniques, including: environmental and analytical operation, phase contrast, sectioning, tilt series acquisition, and tomography for detailed three-dimensional reconstruction. These techniques can be used to examine a variety of materials including metals, insulators, polymers and biological samples. The instrument integrates several technologies allowing for advanced imaging capabilities, such as in-column energy filter imaging (IEF), electron backscatter diffraction (EBSD), time-of-flight secondary ion mass spectrometry (TOF-SIMS), wavelength dispersive X-ray spectroscopy (WDS), electron energy loss spectroscopy (EELS), and low-vacuum imaging. JEOL JEM 2010UHR features a large chamber flange that permits the exchange of a wide variety of sample holders and specimen holders. It is equipped with an automated stage, which permits automatic operations such as topography scanning, line scanning, and particle counting. In addition, μFly™ automated tilting is included, allowing for the automatic change of tilt angles without breaking the vacuum. The instrument is also equipped with a removable sample preparation stage (RSP) which provides access to a range of sample preparation components and accessories. This allows for sample coating, such as with gold, carbon, or platinum, to improve the quality of electron transmittance images. Furthermore, JEM 2010UHR also offers a wide range of in situ imaging accessories such as cryo-coolers, different chambers to perform atmospheric cooling and heating, high-pressure stages, corrosion chambers, and electromagnetic levitators. Overall, JEOL JEM 2010UHR is an imaging monster with powerful capabilities that can be used for a wide range of applications, from simple imaging to complex analytics. It offers a comprehensive suite of imaging and analytical techniques for comprehensive sample analysis in various materials.