Used JEOL JEM 2011 #293668339 for sale

JEOL JEM 2011 is a scanning electron microscope (SEM) that is capable of producing high-resolution images of complex topographical features. The microscope utilizes a cold-field emission beam — an electron gun which produces an electron beam that is then focused by a condenser lens onto the sample. This creates a raster pattern on the sample surface, which is then scanned by an imaging lens, forming a magnified image of the sample surface. This image is then read by a detector, which creates a digital image of the specimen. JEM 2011 a reliable and versatile SEM that has a variety of applications, such as material science, forensic science, and semiconductor research. It has a work chamber, which is a vacuum-sealing chamber and has a sample holder to secure the sample and an observation chamber where images are generated. It can analyze samples that range from a few micrometres to several hundred nanometres in size. The microscope is also capable of collecting elemental and chemical analysis data using Energy Dispersive X-ray (EDX) Spectroscopy and Electron Back Scatter Diffraction (EBSD). JEOL JEM 2011 is equipped with a number of advanced features to maximize user convenience and accuracy. These include an auto-start feature which recognizes the type of sample and automatically adjusts the microscope's parameters to the optimal settings. It also comes with a built-in automated stage control system which allows the sample to be easily and quickly scanned. A range of image and measurement functions, such as intensity contrast, atomic force microscopy (AFM), and digital image processing are available to allow researchers to accurately analyze and study samples. JEM 2011 is a powerful tool in the analysis and visualization of materials. It is capable of providing sharp and detailed images with high contrast and resolution. It can be used to measure the physical and chemical properties of a sample, along with its topography and structures. The microscope also allows for fast sample analysis due to its high speed scanning and automated process. All these features make JEOL JEM 2011 an ideal instrument for a wide variety of laboratory work.