Used JEOL JEM 2011 #293736860 for sale

JEOL JEM 2011 is an ultra-high resolution-scanning electron microscope (SEM) designed to provide unsurpassed imaging of fine details in a range of samples. Its advanced optical and electronic technologies enable high-speed and high-resolution imaging at a resolution of 1nm. JEM 2011 utilizes a unique, low-vacuum Vacuum Field Emission (VFEM) source with a high-resolution multibeam platform for faster, brighter and more uniform imaging performance. The SEM combines the shallow depth of field associated with traditional TEM (transmission electron microscopy) and the large depth of field that can only be achieved with SEM. Using new imaging technologies such as Energy Dispersive X-ray Spectroscopy (EDX), Supersonic Imaging (SI) and Wavefront Optimized Imaging (WOI), JEOL JEM 2011 provides high contrast images of elements in samples. EDX can be used to detect traces of elements in a sample and its spectral line mode provides improved resolution and sensitivity. JEM 2011 also makes use of advanced CCD technology to capture large-sized images at high resolutions. The CCD automatically captures both high and low contrast images, eliminating manual adjustments. Additionally, its optimized shading system makes handling and accurate signal purity easier. For advanced studies requiring a greater level of analysis, JEOL JEM 2011 offers a variable high-voltage acceleration system capable of going up to 2.5kV with +/- 0.25V, allowing for the study of samples at different energy levels. Additionally, JEM 2011 offers high stability and low drift for optimum imaging even at higher accelerations. JEOL JEM 2011 is quick and easy to use due to its simplified operation interface. Its user-friendly menus, icons and touch panel functions allow for a seamless experience. Furthermore, the scanning and imaging performance has been tested and certified for high performance and quality. Overall, JEM 2011 offers ultra-high resolution imaging and advanced analysis capabilities with low drift, low vacuum and high sample throughput, making it highly suitable for detailed and accurate studies. The highly user-friendly operation and ample support functions make it an ideal tool for research.