Used JEOL JEM 2100 #293822851 for sale

JEOL JEM 2100 scanning electron microscope (SEM) is a world-leading analytical instrument with unsurpassed performance allowing users to visualize micrometer and nanometer-sized particles never before seen. JEM 2100 is capable of achieving resolutions down to 0.2 nm at higher magnifications, and can be used to generate 3D datasets of specimens with resolutions at the nanoscale. Its highly adjustable magnification allows users to precisely study details they may not otherwise be able to observe. JEOL JEM 2100 utilizes a novel Schottky Emission gun that enables the achievement of much higher resolution than conventional thermionic emission guns. This has enabled JEM 2100 to achieve unprecedented resolution of 0.2 nm at higher magnifications, allowing for greatly expanded structural data and imaging of nanomaterials. Additionally, JEOL JEM 2100 is equipped with a Cs-corrector which improves imaging resolution by correcting for spherical and chromatic aberration effects. JEM 2100's advanced detectors allow for improved signal to noise ratio. The flood-gun detector, EDAX EDX detector, and imaging detectors allow for easy detection of both elemental and structural data from samples. This allows users to quickly generate data sets and images on a variety of materials. The electron beam can also be modified to achieve different effects. A Condenser Lens modification allows the user to focus the electron beam to obtain a First Order Laplacian shape. This effect can be used to create a 3D dataset of fine details of a sample providing a three-dimensional view. JEOL JEM 2100 also features automated stages that allow for precise movements of the sample while imaging, making the data collection process faster and more efficient. The automated stage allows users to define the area they want to image as well as the scan rate for data collection. JEM 2100's full integration of automation and novel features makes it an ideal instrument for both research and quality control. Its advanced detectors, high resolutions, automated stages, and condenser lens modification all come together to form a powerful STEM. This versatility makes JEOL JEM 2100 the perfect choice for analyzing structural details of various materials.