Used JEOL JEM 2100 #9185479 for sale

Name: JEOL JEM 2100
Brand: JEOL
SKU: 9185479
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Scanning Electron Microscopes

Manufacturer

JEOL

Model

JEM 2100

ID: 9185479

Analytical transmission electron microscope Specimen anti-contamination trap Point-to-point resolution: 0.25 nm (guaranteed by JEOL) Observed Au (002) 0.2039nm, Si (022) 0.19194nm Stage tilt angle: +/-30 degrees for X axis Controller: Double tilt power supply HXA Hard X-ray aperture Retainer EM-21150 for low background EDX analysis Free lens control 200kV Modes: TEM Microprobe TEM Nanoprobe STEM (Scanning transmission electron microscope) OXFORD SDD Thin-window energy dispersive X-ray (EDS) detector GATON Orius 1000 slow scan CCD camera With 2k x 4k Bright field (BF) High-angle annular dark field (HAADF) STEM Detectors: 35mm port Objective pole piece Capable of ±30° tilt Cryo-sample holder: -183°C Double-tilt: ±30° holder Background (Be) EDS holders Accelerating voltage: Maximum accelerating voltage: 200 kV Engineer alignments at 120kV, 200kV Operator alignment at 80kV Electron gun assembly: LaB6 Spare wehnelt assembly Spare DENKA filament – LKSH60SM3 Pole piece: High tilt analytical pole piece (HRP20) EM20720 Specimen holders take standard 3mm grid: JEOL Single tilt JEOL Tilting holder EM31630 +/-30 degrees for Y tilt axis GATAN Cryoholder Model: 636-J1622403N01HC +/-30 Degrees for Y tilt axis faraday cup with heater SATW Ultra-thin polymer window - window for detection of light elements GATAN Double tilt holder (phosphor bronze): Model: 646 +/-30 Degrees for Y tilt axis faraday cup Double tilt power supply TEM Mode: Low mag: 50x - 6,000x High mag: 2,000x - 1,500,000x SA Mag: 8,000x - 800kx Diffraction: 8cm - 200cm MDS Camera: Orius SC1000 CCD camera: 4k x 2k 4008x2670 Pixels interline device 9um x 9um Pixel size Binning 1x, 2x, 3x, 4x Operating temperature = +10ºC STEM Mode: Mag & AMAG modes Image resolution: 1.5 nm with HTP Bright field STEM at 200 kV Low mag: 100x to 15,000x High mag: 20,000x to 2,000,000x JEOL Bright field detector JEOL High angle annular dark field (HAADF) detector Rocking beam Nano probe: Alpha 1-5 Spot size 0.5nm-25nm EDS: Alpha 1-3 Spot size 0.5nm-25nm CBED: Alpha 1-9 Spot size 0.5nm-25nm EDS Detector: SDD 80 mm Solid angle: 0.13sr Resolution: Mn Ka 127eV F Ka 64eV C Ka 56eV Operating systems: Windows XP for JEOL TEM PC Windows XP for GATAN camera PC Windows 7 for OXFORD EDX PC KVMP Switch box for single wireless keyboard Single wireless mouse control Dual monitors Missing part: Gatan double tilt holder (be low background) +/-30 Degrees for Y tilt axis faraday Cup Double tilt power supply Power: 240V/32A 50Hz main All 240V PC run from JEOL transformer TEM is 115V Currently installed.

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JEOL JEM 2100 is a scanning electron microscope (SEM) that has revolutionized the world of electron microscopy. It features a compact and space-saving design, which maximizes laboratory workspace. This cutting-edge instrument is capable of producing high resolution images that are ideal for in-depth analysis. The microscope has a maximum accelerating voltage of 30 kV and current rate of 2 nA, allowing it to take powerful images of its samples. It also comes with user-friendly software that makes operation and hands-on training easier for users. JEM 2100 features a tungsten filament, achromatic objective lens, and a high-precision gun control system. The tungsten filament emits electrons that can penetrate the sample and reveal details normally not visible to light microscopes. These electrons are focused by the achromatic objective lens and then passed through the gun control system, which superimposes signals and images. JEOL JEM 2100 offers a variety of scanning modes to meet a wide range of requirements. Angle-resolved secondary electron images (ARSEI) can be used to analyze very small features and surface topography on samples. In addition, the Scanning Electron Microscopy and Energy-dispersive X-ray Spectroscopy (SEM/EDS) option can be used to identify elements on samples. This advanced instrument can even be used in automated workplace production lines for routine inspections or in research laboratories for critical analysis. JEM 2100 also features a low-noise imaging system, excellent vacuum performance, and high-precision positioning control that accurately centers the sample. JEOL JEM 2100 is the ultimate choice for those looking for an advanced and reliable scanning electron microscope. From its user-friendly interface to its powerful imaging and data collection capabilities, this instrument is perfect for laboratories that require the best electron microscope on the market.