Used JEOL JEM 2100 #9284631 for sale

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ID: 9284631
Scanning Transmission Electron Microscope (STEM) CM Lens High resolution analytical pole piece High contrast objective aperture SIP Vacuum pump Computer Microscope Gas supply Manuals included Equipped with: ASID STEM System BF and DF STEM detectors GATAN 832 Orius SC1000 CCD Camera 11 Mpix GATAN 863 Tridiem post-column energy filter LaB6 Filament: Motorised OL aperture (Mechanical high contrast objective aperture) operating voltage: 120 kV and 200 kV.
JEOL JEM 2100 is a state-of-the-art scanning electron microscope (SEM) designed to give researchers a powerful tool to visualize and analyze tiny objects of less than 500 nm. It comes with several features that make it an ideal choice for many research applications. JEM 2100 is equipped with a tungsten cathodoluminescence detector that offers exceptional contrast resolution for low energy electrons. This enables researchers to accurately determine the material composition of an object. High resolution imaging can be facilitated by the high-sensitivity point detector, allowing researchers to look deep into tiny structures. JEOL JEM 2100 also offers high vacuum levels for sample examination. Whereas most conventional electron microscopes require sample preparation such as chemical coating, JEM 2100 can provide excellent results without the need for sample preparation. This results in time savings, as well as higher-quality images and greater accuracy in the data obtained. JEOL JEM 2100 offers outstanding flexibility for different experiments. It is equipped with an environmental chamber for in-situ analysis of samples in extreme environments. This is a particularly useful feature if the sample is sensitive to contamination or temperature, as the chamber can be used to control both factors. The additional built-in X-ray spectroscopy capabilities of JEM 2100 are particularly advantageous for elemental composition analysis. The x-ray spectrometer can generate spectra of a wide range of materials, including minerals, elements, and compounds. JEOL JEM 2100 provide precise imaging capabilities at magnifications up to 500,000X. This makes it ideal for capturing extremely detailed images of minuscule objects, and those images can then be used for further analysis. Overall, JEM 2100 is an outstanding scanning electron microscopy imaging tool. It offers superior imaging resolution, combined with an excellent range of features to carry out detailed studies of tiny objects. Its flexibility, built-in features, and ease of use make it an ideal choice for researchers everywhere.
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