Used JEOL JEM 2100A #9355536 for sale
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ID: 9355536
Transmission Electron Microscope (TEM)
Lattice image resolution: 0.1 nm
STEM Image resolution: 0.2 nm
FEG Schottky gun (ZrO2 / W)
GATAN UltraScan 894 CCD
GATAN 788 DigiScan II Control box
Chiller with refrigerated circulation system
GATAN Tridiem 863 EELS Detector
MARUYAMA Rotary pump
GOINO Tilt angle: ±30°
GATAN 925 Single tilt holder
Operating system: Windows XP, 32 bit
JEOL UPS
CL Aperture:
200 µm
100 µm
40 µm
10 µm
OBJ Aperture:
120 µm
60 µm
20 µm
10 µm
SA Aperture:
120 µm
50 µm
20 µm
10 µm
JED-2300 EDS Detector Si (Li) (Currently non-functional).
JEOL JEM 2100A is an industry-leading environmental scanning electron microscope (ESEM) designed for a variety of imaging, analysis and sample preparation applications. With an adjustable acceleration voltage ranging from 0.2kV to 30kV, an automated chamber vacuum controller and an automated gas inlet equipment, the microscope offers a wide range of imaging and analytical capabilities. JEOL JEM 2100 A features an environmentally accurate specimen holder, allowing the system to apply a controlled atmospheric pressure in the specimen chamber. This is essential for imaging wet, fragile, and condensation-prone specimens such as living cells or organisms. The spherical and chromatic aberration-free post-column electron optics unit produces high-quality images, with a high resolution of up to 5.4 nm without any additional lenses. The patented EverHigh Sensitivity electron detector and EverHigh Contrast Contrast Detail Enhancement technology let you detect even the weakest signals and visualize the finest detail in beam-sensitive specimens. The OA-EBO5 BSE/SE image processor includes several image processing and analysis operations, such as noise reduction, contrast enhancement, edge detection and quantification. JEM 2100A can also be used for energy-dispersed x-ray analysis (EDX) capabilities. EDX enables elemental analysis of the specimen while maintaining its integrity. The microscope can even be used for transmission electron microscopy (TEM), giving you the power to observe the finest detail of thicker materials and observe relatively large structures in high resolution. JEM 2100 A is equipped with a wide range of hardware features, such as an automated stage, a programmable sample holder, a high-performance digital imaging machine and a powerful controller. This versatile and reliable microscope is compatible with a wide range of apparatus, including sample preparation stages, low-vacuum coating systems and cryospheres. JEOL JEM 2100A is designed to provide unparalleled performance and accuracy for a wide range of applications in materials science, nanotechnologies, biology and medical research. With its exceptionally high resolution and advanced analytical capabilities, JEOL JEM 2100 A can help you achieve unmatched levels of research productivity.
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