Used JEOL JEM 2100F #293628159 for sale
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ID: 293628159
Transmission Electron Microscope (TEM)
OXFORD EDX Detector
Vacuum system controller
STEM Controller
Gun UPS Controller
Air cooling system
Pump
Filter
HT Tank
Piezo controller
Single tilt holder.
JEOL JEM 2100F scanning electron microscope is a versatile, high-performance instrument for examining the topography and detailed compositional profile of a variety of materials. Using a series of electrodes, JEM 2100F produces electrons that are focused and accelerated before they are emitted from a tungsten filament. These electrons are then scanned across the sample surface to create a microscopic image. The 2100F provides high-resolution & high-contrast imaging, with excellent edge-sharpness and depth of field. The electron beam emitted is standardized to 10-20 kV, allowing for quicker operation and more reliable results. The electron beam also has an adjustable current level that allows for a range of applications. In terms of analysis, JEOL JEM 2100F can provide elemental detection, compositional mapping, and elemental contrast imaging. The equipment has a dedicated Energy Dispersive-X-ray detector to identify the composition of different parts of a sample. Furthermore, the 2100F has a variable pressure system that works to reduce sample charging when imaging non-conductive samples. The unit's image acquisition features include variable angle, variable magnification, and variable focus for a wide range of sample images. A built-in XY scanner allows user to select and vary the scan area and resolution from a single field of view. The 2100F also has interchangeable secondary electron, backscattered electron, and fluorescent detectors to provide image contrast for different analyses. In addition, the machine allows for in-situumounted sample analysis, with automatic water cooling and in-situ electrical biasing options available. Furthermore, the 2100F can be used with a variety of automated and manual sample holders to reduce examination time and increase accuracy. Overall, JEM 2100F is a high-performing, versatile and reliable scanning electron microscope (SEM). It delivers an impressive depth of field, high-resolution imaging, and an adjustable electron beam, making it suitable for a range of applications.
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