Used JEOL JEM 2100F #9186593 for sale

JEOL JEM 2100F is a scanning electron microscope (SEM) that provides high-resolution imaging and analysis capabilities for materials research. The microscope is capable of imaging objects at magnifications up to 50000x and has a working distance of up to 6.8 mm for maximum working distance and flexibility. It is equipped with an array of advanced technologies including a monochromated electron gun, a high-speed wideband detector, an electron optical Gun Microlens, and a Three-dimensional Feimaster Microprobe. Additionally, JEM 2100F utilizes a variety of unique electron source technologies, such as its low-vacuum (LV) operation and variable-pressure (P) operation, as well as its Freeze Fracture-Reducing Gas (FFRG) option, which allows for improved control of the electron beam. The microscope has an advanced imaging system which includes backscatter imaging (BI), secondary electron imaging (SEI), and energy dispersive spectroscopy (EDS), enabling users to perform various kinds of advanced analytical techniques. Furthermore, JEOL JEM 2100F is equipped with an extended range of features including a low-dose imaging mode, a digital readout stage, a high-resolution rotating anode, and a low-angle video system, allowing users to obtain the most detailed and accurate images possible. All of these features combine to make JEM 2100F one of the best scanning electron microscopes on the market, offering unsurpassed imaging and analysis capability for materials research.