Used JEOL JEM 2100F #9204937 for sale

JEOL JEM 2100F is a high-performance scanning electron microscope (SEM) that can provide a range of powerful imaging and analysis options for a variety of applications. Thanks to its advanced technology, it offers superior resolution, contrast, and imaging capabilities. This makes it an ideal choice for semiconductor, biological, and material analytics. The imaging capabilities of JEM 2100F are powered by an impressive array of three-dimensional tomographic imaging features. The multi-directional beam scanning allows for fast capture of high-resolution images with an overall live field of view up to 18mm. This ensures that complex structures with small details can be easily captured without sacrificing object resolution. The instrument is equipped with an automated navigation motor stage, enabling efficient specimen handling. The integrated Specimen Center Detection (SCD) system helps to ensure accurate positioning of the sample. The secondary electron detector (SED) offers high sensitivity that ensures superb contrast with better signal-to-noise ratio. The automated changeover function makes operation of JEOL JEM 2100F easy and efficient. It works with a range of specimen holders, making it possible to image a broad range of samples. It is equipped with a high resolution color camera with a built-in LED work illumination that provides excellent, real-time imaging capabilities. The advanced LCD touch panel controller provides intuitive control over instrument settings. This makes it simple to configure appropriate irradiation parameters and to store images. Several analysis features are available, including an Energy Dispersive X-ray Spectroscopy (EDS) system and an electron backscatter diffraction (EBSD) detector. JEM 2100F is an all-in-one scanning electron microscope with a wide breadth of features and technology. It is reliable, easy to operate, and provides superior imaging capabilities. It is an exceptional choice for applications that require superb resolution, contrast, and analytical capabilities.