Used JEOL JEM 2100F #9236895 for sale

JEOL JEM 2100F is a scanning electron microscope (SEM) with an accelerating voltage range of 1-30kV. Its theoretical resolution and three-dimensional imaging capability allow for direct observation of even the smallest specimens without the need for staining or processing. Through its adjustable working distance, JEM 2100F accommodates large and bulky objects as well as standard size specimens. The SEM is equipped with a field emission gun (FEG) that produces a fine electron beam with an electron source guaranteed to produce a stable voltage. This stability ensures high resolution imaging with an excellent point-to-point resolution of 4nm. The secondary electron imaging mode allows for three-dimensional imaging of the specimen while the backscatter electron mode provides information regarding specimen composition. The SEM also includes a side detector to observe specific details of the sample at a larger scale. An intelligent design combined with the capability of pattern recognition enables automatic focusing and the alteration of brightness and contrast levels based on the need of the user. A specimen mapping feature allows for the acquisition of images from various parts of the sample without the need to move the stage. The large depth of field of this SEM enhances imaging of thick specimens. JEOL JEM 2100F is an intuitive instrument that comes equipped with a convenient touch screen control panel. This control panel allows the user to adjust a multitude of settings such as accelerating voltage, current, and particles as well as zoom, focus, and brightness levels. It also allows for the alteration of resolution, magnification, and field of view. In addition to these features, JEM 2100F is equipped with an on board PC which includes Windows 10 Professional and JEOL software for data storage and processing. This software allows for the manipulation of images, annotation of labels, and control of the instrument directly from the PC. Overall, JEOL JEM 2100F is an advanced scanning electron microscope, designed to allow for detailed observation of even the most minute features of various specimens with high accuracy and clarity. Its ability to handle large and bulky objects, combined with its multi-featured control panel and on-board PC, make it an ideal choice for various scientific and research purposes.