Used JEOL JEM 2100F #9249571 for sale

JEOL JEM 2100F is a high-performance, high-resolution scanning electron microscope (SEM) that combines powerful, state-of-the-art imaging and analytical technology with intuitive, user-friendly operation. The system features a wide range of applications, from routine imaging to the possibilities of 3D and spectroscopy, providing unparalleled imaging and analytical capabilities. The system is built on a CCD imaging system, offering true high resolution imaging in all three techniques; conventional secondary electron, backscattered electron and in-lens detection. With its high-performance, high-resolution CCD sensors, JEM 2100F is capable of producing detail-rich images and data at resolutions of 1nm and beyond. Advanced detectors, including an energy dispersive X-ray detector and a total energy detector, provide high-quality analytical data and yield accurate results in elemental analysis and chemistry profiling. JEOL JEM 2100F is also equipped with a multi-axis sample stage, allowing the user to easily manipulate and move the sample for different angles and perspectives, as well as to image larger areas. Additionally, the built-in digital camera provides convenient sample viewing and inspection. Advanced features, such as the dual high-contrast micro-manipulator and the dual side heating and cooling plates, provide further flexibility and control to the user. Overall, JEM 2100F is an ideal choice for a wide range of electron microscopy applications due to its high performance, detailed imaging and analytical capabilities. Its ease of use and intuitive operation make it particularly well suited to the laboratory or research setting, making it a highly valuable asset.