Used JEOL JEM 2100F #9255945 for sale

JEOL JEM 2100F is a scanning electron microscope (SEM) designed to provide high quality, high resolution imaging and analysis of specimens. This advanced SEM offers improved resolution and contrast, shorter imaging times, and enhanced sample preparation capability. Its advanced electron optics provide a wide range of imaging and correction modes tailored to the needs of demanding researchers. JEM 2100F's electron source utilizes a field-emission Schottky gun with tungsten filament, enabling it to produce high-energy electrons quickly and efficiently. The accelerating voltage range is from 5 to 20 kV, with an accurate resolution of +/- 0.1 V and an electron current of up to 0.9μA. The specimen is scanned electronically by 30kV-20μA beam which can be operated at different resolutions, depending on the imaging objectives. The SEM is also equipped with a fast-scanning region detector option to improve imaging speed and resolution over Standard High-Resolution (SHR) imaging modes. The system's imaging suite includes both high and low-angle imaging, which offers researchers a range of possibilities for obtaining whole-image imaging of samples. Additionally, the Full-auto Navigation (FAN) mode allows the user to quickly and accurately access any area of interest on the sample without manual adjustment of the beam position and image enhancement. The FAN mode is ideal for users wishing to explore areas of interest more deeply than possible with conventional SEM techniques. JEOL JEM 2100F is also equipped with an array of advanced dedicated accessories including a remote-controlled sample-change unit, detached control console, and an automated diffraction imaging system for crystal structure analysis. The optional advanced-beam-alignment and auto-sampler modules allow the user to precisely align and maneuver the beam over the sample with computer-controlled ease. JEM 2100F is ideal for applications such as cross-sectional and high-resolution imaging of biomaterials and detailed analysis of nanomaterials. With its capability for high resolution imaging and analysis, JEOL JEM 2100F provides a comprehensive scanning electron microscope solution for researchers demanding full control and maximum precision when studying samples.