Used JEOL JEM 2100F #9300950 for sale

JEOL JEM 2100F is a field emission scanning electron microscope (FESEM) with a high packing degree combined with a high resolution. It has a superior combination of conditions, which are optimized for reliable and reproducible image quality. The microscope is designed for optimal performance in both low and high resolution studies and for imaging any surface morphology. JEM 2100F has a 10 keV FEG electron source with an in-column energy filter, top/bottom channeltron detectors, as well as an impressive 35 mm wide specimen chamber. The FEG source maintains a very low emittance, so it generates a highly uniform image when imaging with low or high resolution. It also has a low beam current, maintaining performance and stability. The dual EDS detectors ensure fast and accurate composition analysis. The microscope is equipped with a three-dimensional, auto-alignment system that automatically aligns the electron column to the sinusoidal coils. This also makes it easier to maintain proper alignment when doing low or high resolution imaging. The large aperture makes it ideal for imaging large areas with uniform coverage. The combination of a high magnification with a small working distance improves the image quality and resolution. JEOL JEM 2100F is a versatile instrument that can be used for a variety of applications. It is designed for imaging a range of specimen types, including cells and bacteria, particles and fibers, thin films and layered structures, as well as a range of materials such as metals, ceramics and composites. It is ideal for high-resolution imaging, elemental and structural analysis. JEM 2100F offers excellent image and analysis precision, faster scan times, and superior repeatability. The dual detector systems allow for faster data acquisition and improved resolution than single detector systems. Alongside this, the fine focus and small beam step height features ensure that accurate and highly detailed images can be obtained. Overall, JEOL JEM 2100F is an invaluable microscope for imaging and analysis of a variety of specimens and materials. It offers superior resolution, high speed imaging and maximum stability, allowing users to obtain the comprehensive results they need quickly and accurately.