Used JEOL JEM 2200FS #293587150 for sale

Name: JEOL JEM 2200FS
Brand: JEOL
SKU: 293587150
Availability: InStock

URL successfully copied!

Tap to zoom

Scanning Electron Microscopes

Manufacturer

JEOL

Model

JEM 2200FS

ID: 293587150

Transmission Electron Microscope (TEM) Performance parameters: FEG with ZrO/W(100) Schottky emitter Point resolution: 0.23 nm Line resolution: 0.10 nm 3-stage Intermediate lens system: 4-stage Projective: 2-stage Rotation-free imaging Innovative goniometer with 5-axis position control Piezo drive directions: X, Y Sample holder system with double O-Ring seal and ultra-clean high vacuum pump Cold trap Automatic heating system Sub-control systems: High voltage, goniometer, control panel Vibration damping type: Air mount Screenless operation via HDTV Camera system 1344 x 1024 pixels EM-FS: In-column filter system (4) Sector magnets Motor controlled 4-fold input panel Energy filtering: TEM, STEM Isochromaticity: <1 eV via 2k CCD Chip Geometric distortion: <1 % Detector resolution: used camera system Spectra CCD Camera, Film-negative Spectroscopy: Filter energy resolution: <0.15 eV EELS spectra speed: up to 50ms / Spektrum Dispersion detector level: 50-400u/eV (at 200 kV) GATAN UltraScan 1000 approx. 0.28-0.035 eV/pixel Readout speed: up to 10 spectra/sec Motor-controlled energy selection slot 702-70P-FEF: GATAN In-column filter Ratio map 704-00P: EELS analysis (704,00P) EM-20590: Electrode short voltages 200 kV EM-07320: Motorized lens hood for HR, HT, CR or HC pole shoe EM-20360: Motorized Hard X-Ray Aperture EDX analysis for UHR Polschuh JEM-2200FS: STEM Digital raster transmission unit EM-20670: Primary jet catcher EM-24580: Dark field imaging detector system, STEM EM-24630UH: Dark field imaging detector system STEM, EELS EM-21301: Piezoelement controlled 994.20P.2: GATAN UltraScan1000XP CCD Camera 2048 x 2048 pixels 100/200keV Specification: Sensor: 2048 x 2048 Pixels (à 14um) Full Frame CCD Scintillator: HCRTM Phosphor scintillator (P+) Coupling: HCRTM Fiber optics Binning: 1x, 2x, 4x, 8x Readout speed: 4.0Mpix/sec (4x1MHz) Frame Rate: 5fps at 4x binning, 512 x 512 pixels Digitization: 16Bit Readout noise: <20CCDe- at 1MHz MTF: 25% at 1/2 Nyquist (100kV), 17% at 12 Nyquist (200kV) Cooling temperature: < -24°C Camera head UltraScan camera housings TEM Adapter Post-Specimen shutter control lEEE1394b Computer interface IBM-Compatible computer system Fully motorized bezels TFT Monitor Operating system: Windows Power supply: 80, 100, 120, 160, 200 kV PC.

Read More Close

JEOL JEM 2200FS is an innovative scanning electron microscope (SEM) that is capable of producing high-resolution images and detailed analyses of specimens. The highly efficient electron optics of JEM 2200FS provide high-quality images with an ultimate resolution of 1.2nm. The high-resolution secondary and backscattered imaging capabilities enable precise and detailed characterization of the specimen's atomic level features. JEOL JEM 2200FS uses a field emission source, which ensures high brightness and low noise levels. In addition, the probe current is adjustable between 1pA and 10nA, allowing for a wide range of imaging applications. The beam deflection system of the SEM utilizes an electromagnetic field with a uniform field size and a wide range of deflecting angles to correct for any specimen tilt or drift. The beam scan mode and operation controls offer considerable flexibility in controlling the electron beam parameters, allowing for amazing resolution and high magnification imaging. The specimen chamber of JEM 2200FS can accommodate a wide variety of samples, from conventional samples to 3D objects and even biological samples. Moreover, this SEM is equipped with an array of automated coating systems for sample preparation. This automated process allows for high uniformity and repeatability, ensuring that the samples are properly prepared for analysis. In addition, JEOL JEM 2200FS supports a variety of signal detectors, including a secondary electron detector, a backscatter electron detector, a signal electron detector, and an energy dispersive X-ray detector. These detectors are designed to capture fine details of the specimen composition, allowing for in-depth analysis. Overall, JEM 2200FS is one of the best SEMs available. Its excellent electron optics, advanced detection capabilities, automated coating systems, and wide range of performance features make it an ideal choice for various imaging and analysis tasks.