Used JEOL JEM 2200FS #293587150 for sale

JEOL JEM 2200FS is an innovative scanning electron microscope (SEM) that is capable of producing high-resolution images and detailed analyses of specimens. The highly efficient electron optics of JEM 2200FS provide high-quality images with an ultimate resolution of 1.2nm. The high-resolution secondary and backscattered imaging capabilities enable precise and detailed characterization of the specimen's atomic level features. JEOL JEM 2200FS uses a field emission source, which ensures high brightness and low noise levels. In addition, the probe current is adjustable between 1pA and 10nA, allowing for a wide range of imaging applications. The beam deflection system of the SEM utilizes an electromagnetic field with a uniform field size and a wide range of deflecting angles to correct for any specimen tilt or drift. The beam scan mode and operation controls offer considerable flexibility in controlling the electron beam parameters, allowing for amazing resolution and high magnification imaging. The specimen chamber of JEM 2200FS can accommodate a wide variety of samples, from conventional samples to 3D objects and even biological samples. Moreover, this SEM is equipped with an array of automated coating systems for sample preparation. This automated process allows for high uniformity and repeatability, ensuring that the samples are properly prepared for analysis. In addition, JEOL JEM 2200FS supports a variety of signal detectors, including a secondary electron detector, a backscatter electron detector, a signal electron detector, and an energy dispersive X-ray detector. These detectors are designed to capture fine details of the specimen composition, allowing for in-depth analysis. Overall, JEM 2200FS is one of the best SEMs available. Its excellent electron optics, advanced detection capabilities, automated coating systems, and wide range of performance features make it an ideal choice for various imaging and analysis tasks.