Used JEOL JEM 2200FS #293748666 for sale

JEOL JEM 2200FS is a scanning electron microscope designed for superior resolution and image quality. It uses a field emission electron source, a special type of electron gun that provides more stable characteristics and higher performance than a thermionic gun. The instrument offers a high-energy resolution of up to 0.05nm, and its 1.2nm spot size is great for imaging processes. Its analytical features include an energy-dispersive x-ray detector, energy loss spectrometers, and a range of filters, allowing users to analyze samples with a range of techniques. Additionally, it is equipped with a computer control system with a 3D sample holder to allow precise motion in three separate axes. JEM 2200FS is also designed for safety, with a digitally-controlled, closed-circle dry pump system, meaning that no sample degradation will occur from essential vacuum operations. This, coupled with its enclosed design, provides great sample protection. The microscope comes with a range of additional features, such as a high contrast SE and BSE stage, digital imaging and auto-leveling, and MIEF imaging mode. Its digital imaging unit also makes it capable of quickly churning out crystal structure images. Overall, this instrument is ideal for sample surface imaging, nanometer-scale measurement, polycrystalline material study, as well as microanalysis of metal, semiconductor, and organic material. It is suitable for a range of fields in materials science, life science, engineering, and more. Thanks to its features, it is becoming increasingly popular among researchers and industrial users.