Used JEOL JEM 3010 #9376084 for sale

JEOL JEM 3010 is a scanning electron microscope (SEM) designed for industrial and research applications. It is capable of achieving image resolutions down to 1.2nm, resulting in extremely detailed images of surfaces and structures. JEM 3010 is equipped with a high-power electron probe allowing for superior depth of field imaging and a superior signal-to-noise ratio, especially for low-kV applications. JEOL JEM 3010 has a large, highly-stable polepiece and a wide angle electron gun assembly which provides a superior electron beam quality and solid stability over a wide range of operation conditions. This setup allows JEM 3010 to maintain a constant beam current and accelerated voltage, even during prolonged observation periods. Instrumentation-wise, JEOL JEM 3010 is equipped with a high-speed digital imaging system which allows for quick and reliable image acquisition. It is further equipped with an integrated, fully automated lensless digital imaging system which reduces imaging time and helps to make the most of available space. For sample and specimen analysis, JEM 3010 is equipped with an automated sampling system which allows for controlled positioning of samples on the examination stage. It also has an integrated EDX detector which measures the energy and number of electrons reaching the sample. This allows for accurate elemental analysis of samples, making JEOL JEM 3010 suitable for quality control and process monitoring. JEM 3010 also offers additional features such as a built-in video monitor, an automated stage control, built-in particle size analysis systems, and optional accessories for sample etching and in-situ electrochemistry. All of these features make JEOL JEM 3010 a powerful and versatile tool for industrial and research applications.