Used JEOL JEM 3200FS #293661300 for sale

JEOL JEM 3200FS is one of the most powerful scanning electron microscopes (SEM) available today. It provides unprecedented levels of performance, allowing for high-resolution imaging and analysis of samples. JEM 3200FS utilizes a high-resolution and high-vacuum field emission gun (FEG) that allows for exceptional resolution, faster operation, improved signal-to-noise ratio, and highly sensitive imaging and analysis. With a resolution of up to 0.8nm, this SEM provides superb images of a wide variety of materials, from inorganic materials to biological specimens. It also provides secondary electron, backscattered electron, and other analytical signals to allow for greater resolution of composition and surface topography. JEOL JEM 3200FS has an SEM chamber that can handle a variety of samples, ranging from small biology samples to larger industrial samples. The chamber has multiple detectors including a Faraday cup, a secondary electron detector, and a backscattered electron detector. This allows for multiple imaging and analysis techniques to be used in one system. JEM 3200FS also features a digital interface that can be used to control the microscope from a remote location. This can help to streamline operations, as well as improve data collection and analysis. This is especially useful when working with sensitive materials that must be handled with care. Finally, JEOL JEM 3200FS uses a suite of user-friendly software to provide powerful data processing and visualization. This software is designed to help automate data acquisition, manipulation and analysis. Overall, JEM 3200FS is a powerful tool for imaging and analyzing a variety of samples. It provides unprecedented levels of performance, making it a valuable tool for any science or research laboratory.