Used JEOL JEM 3200FS #293796361 for sale

JEOL JEM 3200FS is a field emission scanning electron microscope (FE-SEM) that combines high resolution imaging, plus advanced analysis techniques, in a single instrument. JEM 3200FS's advanced imaging and analysis features are enabled by its cold field emission electron source which creates an extremely low-aberration electron beam and its revolutionary new signal channel design. This allows JEOL JEM 3200FS to achieve high resolution images and superior analytical results. The cold field emission source also enables JEM 3200FS to minimize environmental vibration and drift for the ultimate in imaging stability. JEOL JEM 3200FS provides a variety of examination modes, including SE (secondary electron) imaging, BSEM (backscattered electron) mapping, diffraction contrast imaging, cathodoluminescence (CL), and environmental scanning electron microscopy (ESEM). It can also image non-conductive samples in true SE mode with no carbon coating and difficult to image samples in low vacuum (LV) mode. JEM 3200FS's analytical capabilities include energy dispersive X-ray spectroscopy (EDS), X-ray fluorescence (XRF) mapping, electron backscatter diffraction (EBSD), EDS Chemistry Imaging, energy filter imaging (EFI), and hydrogen probe analysis (HPA). JEOL JEM 3200FS is equipped with a full range of chamber accessories, including a full-range ESD/TEM holder, Faraday cup, RF extractor and an electrostatic chuck, which can accommodate samples of different sizes and shapes. The chamber accessories guarantee most efficient and precise measurements, and offer an ideal platform for a variety of imaging and analysis techniques. JEM 3200FS features an intuitive graphic user interface (GUI) and automated operation by the integrated 'smart control'. This allows users to execute complex experiments effortlessly, and simplify processing of large amounts of data with simple commands. JEOL JEM 3200FS also provides a range of computer-related features, including real-time operation control, on-screen preview of function options, and automatic recording and playback utilities. In addition to these features, JEM 3200FS offers a network system to support multiple users. Overall, JEOL JEM 3200FS is a versatile and powerful scanning electron microscope that combines high-resolution imaging and advanced analysis capabilities in one instrument. Advanced imaging techniques with excellent resolutions and high depth of field, make JEM 3200FS an ideal tool for studying the structure and composition of the most complex samples.