Used JEOL JEM 3200FS #9293906 for sale

JEOL JEM 3200FS is an ultra-high resolution scanning electron microscope (SEM) used for imaging a wide range of materials. This instrument was developed with contributions from various industries in order to improve imaging capabilities. It provides users with unrivalled performance due to its high resolution and ease of use. JEM 3200FS offers a wide range of imaging modes, including standard SEM imaging, metallography with low vacuum mode, and backscattered electron (BSE) imaging. It also boasts a large scanning area and is able to achieve higher magnifications than its predecessors. JEOL JEM 3200FS is equipped with a field emission gun (FEG) that is capable of variable pressure and acceleration voltages. This makes the system more efficient and increases both image resolution and sample safety. Furthermore, the FEG enables imaging at a higher electron beam current, offering improved detection of thin layers as well as greater contrast in images. The instrument is also equipped with high-resolution optics including a dual-axis goniometer and an auto-focus system. These provide precise control and higher accuracy when obtaining images. The SEM also features advanced darkfield and delayed imaging capabilities, enabling high contrast images to be obtained quickly and accurately. JEM 3200FS is a reliable and powerful instrument designed for obtaining a wide range of image information. It offers high resolution imaging and a wide range of features, making it an ideal choice for any research, particularly in fields such as materials science.