Used JEOL JEM 5510 LV #293602478 for sale

JEOL JEM 5510 LV scanning electron microscope (SEM) is an instrument that enables extremely high-resolution imaging and surface analysis. It is the ideal choice for researchers looking to achieve unparalleled detail in their imaging of a variety of particle and material types. JEM 5510 LV features a wide range of features that enable researchers to customize their imaging to the specific application. The high-resolution imaging of JEOL JEM 5510 LV is achieved through the use of an in-lens column design and high-brightness electron source. This electron source, combined with the dynamic focusing system, offers an incredibly large range of magnifications from 10X to 2,000,000X. JEM 5510 LV also offers a range of imaging modes such as scanning, secondary electron imaging, and backscattered electron imaging. Additional imaging capabilities include 4-axis specimen stage, 4-quadrant detector, automated Z-distance, and two-axis tilt for large-scale imaging and tilt series. JEOL JEM 5510 LV also features a range of advanced features that make use of the powerful imaging, including advanced energy dispersive X-ray spectrometry (EDS) and automated line-scan mapping with Elemental detection. With JEM 5510 LV's EDS, researchers are able to analyze elemental distributions and determine heterogeneity at the micron and sub-micron level. The automated line-scan mapping with Elemental detection makes it easy to create topographical distributions and identify elements present in each pixel. For optimization of particle images and analysis, JEOL JEM 5510 LV is equipped with an extensive range of contrast enhancement tools. JEM 5510 LV includes features such as automated stigmatic and astigmatic contrast, automated stigmatic detection and minimization, and various Automated Signal Enhancement tools. Additionally, JEOL JEM 5510 LV can be integrated with advanced microscopy systems, such as electron backscatter and energy dispersive X-ray mapping. JEM 5510 LV scanning electron microscope is an excellent choice for researchers who require high-quality images and detailed particle and material analysis. With its wide range of features, users can explore their specimens on the nano and micron level with unparalleled detail.