Used JEOL JEM 9310 #293671410 for sale

JEOL JEM 9310 is a scanning electron microscope (SEM) that offers researchers high resolution imaging in a variety of applications. This instrument is equipped with two high-performance electron gun systems and a variable pressure column, allowing users to investigate samples with superior resolution and quality. The variable pressure column ensures a wide range of experimental pressures (up to 10-4Torr) which is necessary for working with UNCD/CNT materials and other sensitive samples. JEM 9310 is also equipped with a cold-field emission system that provides a clean, low-contrast signal, ensuring high-fidelity images with unmatched clarity and detail. This SEM can be used in a wide range of imaging applications including surface topography, phase shifts, compositional mapping, 3D image tomography, specimen sample analysis, and much more. With its high-resolution imaging capabilities, JEOL JEM 9310 allows researchers to visualize extremely fine features with a resolution of 1.5 nm in secondary electron mode and 7 nm in backscattered electron mode. Additionally, the instrument offers advanced position correction and image boost options to ensure the highest quality images. JEM 9310 is also equipped with several peripheral components, such as an analytical transfer target, specimen camera, spectroscopy systems, and more, allowing researchers to carry out a variety of experiments with ease. Its compact design and low operating costs makes this SEM a great option for laboratories of all sizes. All in all, JEOL JEM 9310 is a great choice for researchers looking to obtain high quality images with superior resolution and accuracy.