Used JEOL JFD 310 #9078437 for sale

JEOL JFD 310 is a compact scanning electron microscope, allowing users to observe surface features of samples at magnification levels up to 160,000x. The unit is equipped with an in-lens secondary electron detector, supplanting a standard Everhart-Thornley detector and providing greater resolution in imaging. Incorporating a high-efficiency distortion-correction equipment, JFD 310 eliminates geometric deformation and creates a clear, cohesive picture for observation. The microscope utilizes an electron beam to travel through the sample and generate a high-resolution image from reflected electrons that are recorded by the detector. A dual deflection system allows the beam to be targeted accurately, while integrated low voltage optics enable researchers to utilize spill-off electrons for further examination and analysis. The unit also features a differential pumping unit, which utilizes a dedicated secondary electron detector vacuum machine for sample transfer/examination, as well as a flexibility that allows for sequential transfer of samples, from low to high vacuum. Home to many advanced features, JEOL JFD 310 offers a magnet lens deflector tool custom built for this model, allowing for improved resistance to misalignment. While the high speed mechanical scanning device creates a mirrored surface on the sample substrate, the built-in charge neutralizer counteracts the repulsive effect between the sample and the electron beam. Additionally, the digital fine focus and parameter search capabilities make working with the microscope simpler and the data gathered more precise. The microscope also includes an integrated PC and data storage device that allows users to move and manipulate collected images on the spot. Equipped with a darkroom, JFD 310 is ideal for studying everything from biological specimens to semiconductor materials. To aid research, the unit further offers a color monitoring asset with 12-bit resolution, custom-made for JEOL JFD 310. Overall, JFD 310 allows researchers to observe samples with high resolution and efficiency in the electron microscope environment. Offering advanced features and stellar image resolution, this powerful scanning electron microscope is an ideal tool for a number of scientific fields.