Used JEOL JFIB 2300 #293671426 for sale

JEOL JFIB 2300 is a focused ion beam scanning electron microscope (FIB-SEM) used for analyzing materials and producing high resolution cross sectional images for materials science research. It can be used for a wide variety of applications, such as analyzing and imaging insulators, metals, biological materials, and nanomaterials. JFIB 2300 combines an integrated 300kV FIB column with a field emission scanning electron microscope (FE-SEM) to efficiently and accurately image and analyze materials. It has an ultra-high resolution ion column capable of accelerating ions up to 300kV and a focused ion beam (FIB) with a resolution of 50 to 200nm. This is ideal for imaging and characterizing nano-structures. JEOL JFIB 2300 has a variety of accessories including an ion source, secondary electron detector, high-angle annular dark field detector (HAADF), backscatter electron detector (BSE), analogue and digital image processors, and different surface treatment systems. It is also equipped with a cryo-sample holder for performing cryo-fracturing and cryo-micromachining. The system is equipped with the JVP software package, which allows for the processing of images at high speed for image contrast enhancement and image sharpening. It is capable of producing three-dimensional images by combining milling and imaging, as well as micro tomography and image stitching. JFIB 2300 is a powerful, versatile FIB-SEM tool. Its high resolution makes it an ideal choice for imaging and characterization of structures on the nanometer size scale. It is suitable for a wide range of scientific and engineering research applications, such as nanoscale science, materials science, and biological sample analysis.