Used JEOL JFIB 2300 #9207231 for sale

JEOL JFIB 2300 is a scanning electron microscope (SEM) that allows researchers to study the microscopic morphology of samples in detail. The microscope is powered by a focused ion beam (FIB) and a scanning electron beam (SEB) that work together to create a highly-detailed image. The FIB has a wide range of settings for adjustability, allowing users to dial in the brightness and zoom to levels as low as 1nm. The ion beam provides a very high-resolution topographical scan from surface features down to the atomic level, and the SEM provides an excellent image from the surface to a depth of 10 μm in the sample. JFIB 2300 offers a wide range of features that make it an essential tool in the lab. The microscope is capable of generating a high-resolution 3D image from the surface of the sample, which is important for examining very small features. The microscope's dual beam enables it to acquire images of both the specimen and the background simultaneously, allowing for improved contrast and resolution. Additionally, the imaging and tilt control systems of the microscope can be adjusted to generate highly detailed images quickly and accurately. The high accuracy of the microscope is attributed to its auto-focusing system and its wide range of detector geometry settings. This enables researchers to observe even the tiniest details with great precision. Additionally, the microscope is equipped with an in-column energy filter which can be used to optimize energy spectra as well as increase contrast and resolution in SEM images. The high-end automated specimen preparation feature provided by JEOL JFIB 2300 is also an invaluable asset in the research lab. It includes an automated sample stage that enables the microscope to rotate, tilt, and automatically focus on different areas of a sample. This allows imaging of multiple areas simultaneously. Additionally, automated SEM imaging techniques, such as backside imaging, allow the microscope to eliminate surface and subsurface features that may interfere with the imaging process. JFIB 2300 is an extremely effective scanning electron microscope for imaging specimens at the nano-scale. Its user-friendly design makes it the ideal tool for researchers looking to assess complex biological and material samples with incredibly high levels of accuracy and detail. The high-resolution of the image and in-column energy filter offer researchers a reliable and efficient way to explore the microscopic features of their specimens.