Used JEOL JFIB 2300 #9409370 for sale

JEOL JFIB 2300 is a scanning electron microscope designed for observing and analyzing nanostructures in nanotechnology. It utilizes advanced electron optics to generate digital images with extremely fine resolution. Its beam current varies from 0 to 300 pA and it is capable of generating images of surfaces at 100 nm resolution. JFIB 2300 contains an energy dispersive spectrometer (EDS), which allows chemical compositions to be identified. This microscope also contains an electron backscatter diffraction (EBSD) unit, which allows the user to obtain information about the crystallographic orientation of samples. A magnetic deflector ensures the electron beam is accurately aligned and a built-in fractionated aperture provides the capability of acquiring images with higher magnifications. JEOL JFIB 2300 is temperature stable and vibration resistant with a long lifetime of usage. It also incorporates several safety features such as safety signaling and anti-static boards for safe operation. The microscope is built with high-precision piezo actuators and a closed-loop positioning system for accurate stage movement and sample positioning. The user interface has a wide range of options and a built-in monitor along with buttons and a mouse for easy operation. Additionally, the interface includes a network connection, allowing it to communicate with an external computer for data analysis. Overall, JFIB 2300 is an incredibly powerful scanning electron microscope capable of producing detailed and accurate images of nanostructures. Its range of features makes it a reliable imaging tool that allows users to easily identify a specimen's physical and chemical structure.