Used JEOL JFS 9855S #293645448 for sale

JEOL JFS 9855S scanning electron microscope is a highly advanced equipment that allows for the detailed analysis of samples at the nano-scale. This microscope utilizes a combination of several imaging technologies, including scanning electron microscopy, secondary electron imaging and backscatter electron imaging. JFS 9855S is a high-performance instrument, featuring a highly competitive level of performance in a variety of applications. The microscope employs a highly specialized type of electron optics, designed to produce a focused and well-defined beam of electrons. The high-resolution scanning electron detector is capable of providing samples with images that have a resolution of up to 1 nanometer. In addition, the system's secondary and backscatter electron detection systems offer the ability to image features that are on the nanometer scale. This allows for a wide range of applications, including sample analysis in materials science and semiconductor manufacturing. JEOL JFS 9855S microscope is also capable of performing a variety of imaging techniques, including conventional scanning electron microscopy, backscatter electron imaging, secondary electron imaging, and energy dispersive spectroscopy. In addition, the system includes a variety of automated controls and user-friendly interface that significantly simplify the process of sample preparation and data acquisition. JFS 9855S also includes several advanced features, such as an automated sputter coating chamber, which allows for the creation of a thin, uniform coating of carbon, gold, or other metals on the sample surface. This uniformly coated sample surface is necessary for the production of high-quality images, as well as for ensuring the sample does not become damaged during the imaging process. With all of these features, JEOL JFS 9855S offers users a tool that is capable of accurately and reliably producing high-resolution images of nanostructures. Overall, JFS 9855S scanning electron microscope is a powerful and highly advanced instrument, designed to offer high performance and reliable results in nano-scale imaging. By leveraging sophisticated electron optics and a wide range of imaging techniques, JEOL JFS 9855S makes it possible to obtain images of nanostructures that are significantly more detailed than can be produced using conventional imaging techniques. With its impressive features and capabilities, JFS 9855S is an excellent choice for users who want to analyze nanostructures or semiconductor samples on a high-resolution level.