Used JEOL JFS 9955S #293642746 for sale

JEOL JFS 9955S Scanning Electron Microscope (SEM) is a powerful analytical tool used for a broad range of applications, including imaging, particle analysis, and surface analysis. It is designed for high-resolution imaging and analysis of a variety of materials, from soft organic materials to harder inorganic composites. JFS 9955S has a robust design, making it ideal for both research and industrial settings. The column of the instrument is equipped with an ultra-stable, direct drive motor that ensures precision positioning of the objective lens and sample. Additionally, its secondary electron detector, which uses scanning and backscattered electrons for imaging, provides high quality images with exceptional levels of detail. Particle and surface analysis can be performed with a variety of detectors, including the ultra-high-resolution "CED" electron detector. This advanced detector has high detection sensitivity, allowing users to analyze and characterize particles of a much smaller size than conventional detectors. Additionally, JEOL JFS 9955S is equipped with an energy dispersive spectrometer (EDS) for elemental analysis. Through the combination of these two detectors (CED and EDS) the instrument can provide both microstructure and elemental analysis, offering higher speed imaging than is possible with other systems. Along with its advanced detectors, JFS 9955S also offers a wide range of advanced features to improve the SEM operation and user experience. The SEM features a variety of automated features, like auto focus, which allow the user to adjust the focus of the instrument quickly and accurately. Additionally, it has a variety of image acquisition and analysis software, allowing users to better monitor specimen parameters and take advantage of post-processing features. Overall, JEOL JFS 9955S is an excellent choice for a wide range of applications involving imaging and particle/surface analysis. It features a robust design and advanced features that allow for higher quality imaging and analysis results. With its powerful detection capabilities, JFS 9955S is an ideal choice for those looking for a high-performance scanning electron microscope.