Used JEOL JFS 9955S #9386880 for sale

JEOL JFS 9955S
ID: 9386880
Scanning Electron Microscope (SEM) Auto loader, 8" Magnification range: 200000X Tilt range: 0° - 60° Stage tilt: 0° - 60° Resolution: 5 nm Accelerating voltage: 15000 V EBARA A10S Cryo pump Chiller High SIM resolution: 7 nm (30 kV) High SEM resolution: 5 nm (1 kV) Auto-loader coordinate: C to C With optical defect inspection system Laser microscope recipe capability Cables included Power supply: 202 V.
JEOL JFS 9955S is a high-performance scanning electron microscope (SEM) designed for use in a wide range of research and development applications. It features a wide array of technologies such as a large low vacuum chamber, a digital imaging system, and a CCD live camera that allow researchers to take advantage of various imaging modes. This SEM is perfect for those who need clear, high-quality images of micro and nanostructures. It enables imaging of low-density, challenging samples, and can reach magnification levels of up to 1,000,000x. JFS 9955S is equipped with an ultra-powerful 15kV variable focus electron column. This ensures that the instrument's performance remains high regardless of the sample material or the imaging conditions. The column also has low aberration and ready-to-scan capabilities, making it perfect for taking detailed images of even the smallest objects. Furthermore, the instrument also has a robust 11-pole high-brightness field emission gun (FEG) that can generate a highly stable low beam current for reliable imaging of low denseness samples. When it comes to imaging capabilities, JEOL JFS 9955S does not disappoint. It comes with a large low vacuum chamber for optimized image resolution at higher magnifications. In addition, the SEM supports live imaging with its CCD live camera and various applications that can be run simultaneously. This allows researchers to take advantage of multiple modes such as secondary electrons and backscatter electrons (BSEs). The digital imaging system also enables automated digital contrast adjustments and manual editing when needed. Lastly, JFS 9955S features a unique Adaptive Scan Control (ASC) mode. This mode allows users to automatically adjust the electron beam current in order to take higher-resolution images while using lower beam currents and longer acquisition times. This means that researchers can get clearer, more reliable images without sacrificing performance or scanning speed. Overall, JEOL JFS 9955S is an incredibly powerful and reliable piece of equipment that is perfect for those who need detail-rich images of even the smallest of objects. With its high-powered FEG, large low vacuum chamber, and ASC mode, this SEM ensures that researchers have the tools they need to conduct their research and development studies successfully.
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