Used JEOL JSM 35C #9192676 for sale

JEOL JSM 35C Scanning Electron Microscope (SEM) is an advanced instrument used in a variety of industries to magnify and identify objects at a microscopic level. This powerful microscope yields high resolution magnifications that display fine features of a sample in detail. Its ability to provide both three dimensional images and elemental compositions makes JSM 35C especially valuable in research fields such as materials science, nanoscience, and industrial solid state and materials research. JEOL JSM 35C is equipped with a scanning electron column that operates through a digital imaging and archiving equipment. Source control and imaging parameters can be customized easily for each sample. It is capable of operating in a variety of modes including secondary electrons, backscattered electrons and backscattered energy spectra. This flexibility makes it an ideal microscope for a wide range of applications, such as the observation and analysis of a surface structure feature, mapping elemental distributions, and analyzing connections between samples. The advanced microscope features an ultimate vacuum of 5x10-7 Torr. It has an emission current range of 0.1 pA up to 100 nA and a standard wavelength of 12.5 nm. Its detection system is optimized to achieve superb resolution performance and contrast with low noise. Aimed to minimize sample damage, JSM 35C possesses an ultra-low vacuum of 1x10-6 Torr. The digital imaging and archiving unit of JEOL JSM 35C includes motor control functions for stage movements, detectors, and stages. It can store up to three million images, collect data in tables and can also generate a report from the data or images. Furthermore, the machine offers user-friendly network connectors and software. JSM 35C is an ideal tool for research due to its advanced capabilities and features such as ultimate vacuum, low noise, and ultra-low vacuum operation. It is well-suited for a wide range of applications such as materials science, nanoscience and industrial solid state and materials research. The integrated digital imaging and archiving tool allows for easy storing and reporting of data and images, adding to the overall utility of JEOL JSM 35C.