Used JEOL JSM 35C #9355833 for sale

JEOL JSM 35C scanning electron microscope (SEM) is an instrument of high performance designed for routine and analytical imaging capability. The instrument is equipped with a field emission gun (FEG) which produces a highly illumination electron beam that has a 30 kV accelerating voltage and is capable of achieving a resolution of up to 1.5 nm. The system is also equipped with an EDS detector, allowing for semi-quantitative elemental analysis of samples. JSM 35C also provides a variety of imaging techniques. This SEM is equipped with both secondary electron imaging (SEI) and backscattered electron imaging (BSI) capabilities. SEI allows the user to visualize surface morphology, topography, and elemental compositionof a sample. BSI allows for the observation of structure and internal features of a sample on a nanometer scale. An automated stage allows for the accurate positioning of a sample under the electron beam. The samples that can be imaged using this SEM can be anywhere from several millimeters to several micrometers in size. The SEM can also accommodate samples at temperatures up to 1000°C with the use of a suitable specimen holder. JEOL JSM 35C is a versatile instrument, capable of automatically performing precise measurements of sample parameters such as size, surface area, and thickness. In addition, the SEM can be used for imaging plants, animal specimens, and other objects in three dimensions. The resolution of the SEM is not limited by its pixel array, making it possible to obtain extremely high resolution images of objects that would not be possible with other imaging techniques. The built-in sample preparation features of JSM 35C allows for the coating of samples with a thin layer of conductive material in order to protect and preserve the sample from damage from the electron beam. It is also possible to manipulate the brightness and contrast of an image by adjusting the detector sensitivity and electron beam conditions. Finally, the SEM includes the capability for automatic navigation control of the beam, allowing for the selection of larger areas of a sample with one click. Overall, JEOL JSM 35C is an ergonomically designed scan electron microscope that provides users with a range of advanced imaging capabilities with high resolution. With the addition of its automated sample preparation, navigation control, and measurement capabilities, JSM 35C is capable of performing many of the most analytically demanding tasks with ease.