Used JEOL JSM 5200 #293655828 for sale

JEOL JSM 5200 is an advanced scanning electron microscope (SEM). It is built using advanced technologies in electron microscopic design, allowing it to image at high resolutions. JSM 5200 has an accelerating voltage range of up to 30 kV and utilizes secondary electrons, back-scattered electrons, and transmitted electrons to generate electron patterns that can be used to analyze surface morphology and chemical composition. It also has a chamber with an emission detector, allowing it to detect specimen gases and chemicals that may effect analysis. JEOL JSM 5200 is equipped with a robust imaging equipment that produces a large field of view with a high resolution. Its Digital Pulse Processor (DPP) provides ultra-high sensitivity, allowing for improved contrast and resolution. The microscope also has a detection system with a high-speed detection capability that offers fast acquisition speeds. The unit is also capable of collecting data from the specimen in multiple channels, allowing for a variety of analysis results such as element mapping and chemical compositional analysis. JSM 5200 has an advanced specimen stage control machine that provides precise positional and angular control for exact sample positioning. The beam control tool provides precise and high contrast images by controlling beam current, deflection, spot size, beam focus and astigmatism. The microscope is capable of performing automated scanning and alignment of multiple sample stages, and is also capable of automatic image processing. JEOL JSM 5200 has an intuitive control asset that allows users to quickly set up experiments and control the microscope performance levels. The microscope is also compatible with a wide array of imaging software packages including JEOL own SEMI suite. The model can also be connected to peripheral devices such as detectors and x-ray source to accommodate a variety of analysis techniques, including secondary electron microscopy (SEM), scanning transmission electron microscopy (STEM), energy dispersive spectroscopy (EDS), energy filtered imaging (EFI), and x-ray fluorescence (XRF). Overall, JSM 5200 is a powerful and versatile scanning electron microscope that is capable of providing a variety of imaging and analysis capabilities. With its advanced imaging equipment, powerful sample stage control, and intuitive control system, this microscope can help users find and analyze highly precise information, facilitating a wide array of research and analytical needs.