Used JEOL JSM 5200 #293663420 for sale

JEOL JSM 5200 scanning electron microscope (SEM) is a versatile and powerful instrument for detailed microscopic measurements. Through the high resolution imaging capability of this instrument, small objects and features of interest can be observed in great detail with magnifications up to x 140,000. The electron source used in JSM 5200 is a thermionic field emission gun (FEG), which has the advantage of rapid start-up and great stability. The sample to be observed is charged with an electron beam in the vacuum chamber of the system, and the resulting secondary electron image is then captured and displayed on the monitor. JEOL JSM 5200 includes several features to help improve the quality of the images. Among these features, there are automated focus adjustment, Defocus Drift Correction, Astigmatic Correction, and Digital Super Resolution, which allow for precise control of image quality and resolution. The innovative Digital Super Resolution technology allows the system to capture more information on features close to each other, producing images with superior sharpness compared to traditional technology. In addition to the aforementioned technologies, the instrument comes with a range of detectors that detects electrons reflected off the sample in various ways, allowing a multitude of measurement capabilities. These detectors include a secondary electron detector, a backscatter electron detector, a cathodoluminescence detector, and an energy-dispersive X-ray detector. The latter provides element-specific imaging and allows for the analysis of chemical composition at the sample surface and next to it. JSM 5200 also offers the software package AZtecLive for advanced image analysis. This software provides a range of advanced functions, including automated point selection and contrast adjustment, as well as spot and line profiles, which can be used to measure various parameters of the sample. Furthermore, JEOL JSM 5200 is easy to use, as the user interface is intuitive and contains a wide range of user-friendly functions. This system is ideal for many observation applications in various fields, such as material science applications, failure analysis studies, biological tissue observation, and nanoscale research.