Used JEOL JSM 5200 #9176403 for sale

JEOL JSM 5200 is a high performance, scanning electron microscope (SEM). It combines the efficient capabilities of a variable pressure SEM with those of a high resolution SEM, providing researchers with unparalleled convenience and precision. The microscope features a highly sensitive energy dispersive X-ray (EDX) detector, enabling high resolution elemental analysis. Additionally, it is equipped with an adjustable specimen chamber for an easy operation and optimum results. The device is popular among a range of industrial and academic research, due to its advanced capabilities. JSM 5200 has a working distance of 3mm and an additional range of up to 3.6mm onto which a large variety of specimen sizes can be attached. In addition, it has a 13.6mm aperture for air flow, allowing users to work in a healthy environment. The SEM works with a range of different backscattered electrons detectors, giving users the flexibility to suit their needs. The microscope also features an Everhart-Thornley secondary electron detector, for maximum stability at extreme magnifications. JEOL JSM 5200 provides users with an excellent resolution of up to 1.7 nm. This allows researchers to observe intricate details normally unseen with conventional microscopes. The scan systems are designed to allow researchers to set up arbitrary interrogation patterns, making it possible to perform complex studies. The SEM is equipped with an automated navigation system that guides users step-by-step through their experiments for maximum success. The software's user interface is easy to understand and navigate, allowing for speedy operation. This SEM provides superior speed and accuracy on elemental analysis, while users have the ability to store their data for future reference. The instrument features a 30 kV/200nA electron source and is capable of high resolution imaging without any sample preparation. Its automated stage ensures sample staging optimization, saving users valuable time and ensuring accurate results. This makes it ideal for qualitative analysis and basic research. Overall, JSM 5200 is an advanced scanning electron microscope, perfect for a range of research applications. It provides excellent resolution and is capable of elemental analysis, making it one of the most sought-after SEMs in the market.