Used JEOL JSM 5310 #293607014 for sale

JEOL JSM 5310 is a scanning electron microscope (SEM) which combines high resolution, high speed imaging and unparalleled analytical capabilities. Its Wide Field STEM (WF-STEM) imaging system of an efficient high voltage electron source has been designed to produce an unparalleled level of 3D image resolution. Its high performance silicon drift detector amplifies and enhances the signal from the SEM from small particles, low contrast features, and areas with low Z elements. Additionally, the wind field mode allows for rapid and wide area imaging of a sample over different tilt angles. JSM 5310 is equipped with a single-column low vacuum system that preserves delicate sample structures and provides direct surface contact of the sample stage. The fine-tune scanning technology also offers higher accuracy and stability for various imaging modes, such as ASTAR and Real-time Structure Detection. The Reduced Pressure Mode (RP Mode) allows for reduced chamber contamination during long-term observations in low vacuum. JEOL JSM 5310 is an advanced imaging system capable of ultra-high resolution and high throughput. The combination of high image contrast, high speed and low noise makes it suitable for all kinds of nanoscale materials, such as integrated circuits, nanowires, grids, nano-electromechanical systems and more. Its CrystalSnapper function offers real-time automatic visualization and crystal recognition, which is useful for life science applications. An optional Secondary Electron (SE) Detector can be added to JSM 5310 to provide increased SE sensitivity, SE contrast and SE dynamics. This SE detector can also improve the stability and contrast of elemental maps and qualify samples in more detail. The JSM 530's Compact Mode is also an interesting feature which helps maximize the imaging results in a smaller footprint and reduced cost. Overall JEOL JSM 5310 is an ultra-high resolution SEM that caters to a broad range of high-end analytical needs with its advanced imaging technologies, low vacuum imaging capabilities, and its optional SE detector. Its high-quality imaging results and sophisticated analytical functions make it an ideal choice for most of imaging and analytical needs.