Used JEOL JSM 5310 #9168864 for sale

JEOL JSM 5310 is an advanced scanning electron microscope designed to provide high quality imaging capabilities with excellent resolution, allowing for the close viewing and detailed analysis of a wide range of specimens. JSM 5310 features a high-resolution thermal field emission gun (TFEG) with enhanced electron optics for increased resolution and the ability to generate high-resolution images of a wide variety of samples. The microscope is constructed in an ultra-stable, low-vibration, shielded enclosure that enables the user to obtain noise-free, low drift images with excellent resolution, contrast, and depth of field. This equipment is ideal for imaging applications requiring precision at the nanometer scale such as CD measuring, 3D imaging of dense samples, atomic force microscopy, and electron-optical contrast imaging. JEOL JSM 5310 has an integrated digital image processing system built into the microscope, which allows users to manipulate images quickly and intuitively. The advanced ProScan II Real-Time CCD detector unit allows for high-contrast imaging with a fast refresh rate, providing crisp images with minimal signal noise. The CCD detector also includes a high-sensitivity ElecPhase analysis feature for microanalysis capabilities. The microscope has a large working distance of 25mm and a high magnification range of up to 500,000x, allowing it to produce extremely detailed images on samples of virtually any size. The large magnification range also makes JSM 5310 perfectly suited to a wide range of applications, such as microstructural studies, optical lithography, reverse engineering, semiconductor processing, and materials characterization. The microscope is equipped with a dedicated software package for controlling all aspects of the imaging machine, and features an extensive range of options for users to be able to tailor the configuration to their specific needs. It is completely PC-based, giving users the ability to store and analyze their data quickly and conveniently. JEOL JSM 5310 provides an easy to use, highly reliable and data-rich tool for imaging applications of almost any type. It is an ideal choice for high-resolution imaging and microanalysis of a wide variety of specimens, and is capable of providing outstanding results for applications ranging from research and development to production and quality control.