Used JEOL JSM 5310 #9251693 for sale

JEOL JSM 5310 is an advanced scanning electron microscope (SEM) designed for research and analysis. It is capable of producing high-resolution images of materials at various magnifications, ranging from low magnification up to magnifications of up to 300,000x. JSM 5310 features a state-of-the-art multi-detector system, providing an array of imaging capabilities such as bright-field, dark-field, and dual-beam imaging. JEOL JSM 5310 offers high-sensitivity Li-ion detectors, field emission electron gun, a high resolution Z-axis manipulator, and EDS (Energy-dispersive X-Ray Spectroscopy). It comes equipped with a large tiltable sample holder and a powerful X-Y-Z stage for easy sample positioning and manipulation. JSM 5310 utilizes a multi-wire scanning system for producing incredibly high resolution images and spectra. This system is capable of producing images with a resolution of 0.3 nm, allowing the user to detect the smallest features of a sample. In addition, it can detect small particles by generating contrast between them and the background material, resulting in high-contrast images. JEOL JSM 5310 supports several automated analysis and image processing functions such as FIB/SEM, Automated SEM Image Acquisition, and automated pattern recognition. These functions are especially useful for the analysis of large volumes of data. Moreover, the unit can also be connected to a computer for data collection and manipulation. Finally, JSM 5310 can be used together with many other analytical instruments and sampling techniques, making it a powerful and versatile tool. It is capable of producing images and spectra of materials at very high resolutions, allowing for a detailed analysis of their structure and composition. JEOL JSM 5310 is a powerful tool used by researchers in fields such as biology, materials science, nanotechnology, and more.