Used JEOL JSM 5400 #293771286 for sale

JEOL JSM 5400 is a state-of-the-art scanning electron microscope (SEM). It features high resolution, excellent performance, and reliable operation. JSM 5400 operates under variable pressure adaptive contrast (VPA-STEM) and variable pressure scanning electron microscopy (VP-SEM). VPA-STEM techniques allow users to obtain both high-resolution images and high-contrast images over a wide range of magnifications. VP-SEM techniques enable users to obtain topographical and chemical information under non-destructive low-pressure conditions. JEOL JSM 5400 is also equipped with a comprehensive suite of EDS and cathodoluminescence detectors and beam optical components, making it one of the most versatile SEMs in existence. JSM 5400 has a large working stage which can accommodate samples up to 130 x 130 mm in size, while its large chamber diameter enables users to maximize imaging field of view. Its advanced column design also enables users to obtain top-quality, low noise images at high magnifications and all points in between. The ultra-precise image focusing provided by JEOL JSM 5400's column design ensures that images remain in sharp focus even when tilted or inclined. This scanning electron microscope utilizes an efficient and reliable high-performance EDX (energy dispersive X-ray) system to enable users to acquire elemental composition information. The EDX system is composed of an X-ray detector, a gas ionization chamber and an ion detector. This high-performance EDX system is also equipped with advanced software that can be used to evaluate elemental composition data obtained from a wide range of element types. Finally, JSM 5400 is also capable of capturing topographical images with excellent contrast. Its advanced column design also provides a high dynamic range, allowing users to acquire various signals such as protrusions and recessions on the surfaces of their samples. JEOL JSM 5400 is an invaluable tool for research purposes, enabling users to capture detailed images and acquire comprehensive elemental composition data for a wide range of specimens.